Autori: Djoric-Veljkovic Snezana M
| Naslov | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article) |
| Autori | Zivanovic Emilija N Veljkovic Sandra  Mitrovic Nikola I Jovanovic Igor D Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Dankovic Danijel M
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| Info | MICROMACHINES, (2024), vol. 15 br. 4, str. - |
| Projekat | Serbian Ministry of Science, Technological Development and Innovation |
| Ispravka | Web of Science Članak Elečas Rang časopisa |
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| Naslov | Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications (Article) |
| Autori | Mitrovic Nikola I Veljkovic Sandra Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Zivanovic Emilija N Prijic Zoran D Dankovic Danijel M
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| Info | MICROELECTRONICS RELIABILITY, (2022), vol. 138 br. , str. - |
| Projekat | European Union [857558]; Republic of Serbia [451-03-9/2021-14/200102] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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| Naslov | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article; Early Access) |
| Autori | Veljkovic Sandra Mitrovic Nikola I Davidovic Vojkan S Golubovic Snezana M Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Stankovic Srboljub J Andjelkovic Marko Lj Prijic Zoran D Manic Ivica Dj Prijic Aneta P Ristic Goran S Dankovic Danijel M
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| Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. br. , str. - |
| Projekat | European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Davidovic Vojkan S Golubovic Snezana M Veljkovic Sandra Mitrovic Nikola I Djoric-Veljkovic Snezana M
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| Info | MICROELECTRONICS RELIABILITY, (2021), vol. 126 br. , str. - |
| Projekat | Ministry of Education, Science and Technological Development, Serbia [OI-171026, TR-32026]; [F-148] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics (Article) |
| Autori | Spassov Dencho Paskaleva Albena Guziewicz Elzbieta Davidovic Vojkan S Stankovic Srboljub J Djoric-Veljkovic Snezana M Ivanov Tzvetan Stanchev Todor Stojadinovic Ninoslav D |
| Info | MATERIALS, (2021), vol. 14 br. 4, str. - |
| Projekat | Bulgarian National Scientific Fund [KP-06-H37/32] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Impact of gamma Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks (Proceedings Paper) |
| Autori | Spassov Dencho Paskaleva Albena Davidovic Vojkan S Djoric-Veljkovic Snezana M Stankovic Srboljub J Stojadinovic Ninoslav D Ivanov Tzvetan Stanchev Todor |
| Info | 2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019), (2019), vol. br. , str. 59-62 |
| Ispravka | Web of Science Citati: Web of Science Scopus |
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| Naslov | NBTI and irradiation related degradation mechanisms in power VDMOS transistors (Article; Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stankovic Srboljub J Prijic Aneta P Prijic Zoran D Manic Ivica Dj Dankovic Danijel M |
| Info | MICROELECTRONICS RELIABILITY, (2018), vol. 88-90 br. , str. 135-141 |
| Projekat | Ministry of Education, Science and Technological Development of Republic of Serbia [OI-171026]; Serbian Academy of Science and Arts (SASA) [F-148] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | A review of pulsed NBTI in P-channel power VDMOSFETs (Review) |
| Autori | Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Prijic Zoran D Golubovic Snezana M Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2018), vol. 82 br. , str. 28-36 |
| Projekat | Ministry of Science of the Republic of Serbia [OI-171026, TR-32026]; SASA [F-148] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors (Article) |
| Autori | Davidovic Vojkan S Dankovic Danijel M Ilic Aleksandar Manic Ivica Dj Golubovic Snezana M Djoric-Veljkovic Snezana M Prijic Zoran D Prijic Aneta P Stojadinovic Ninoslav D |
| Info | JAPANESE JOURNAL OF APPLIED PHYSICS, (2018), vol. 57 br. 4, str. - |
| Projekat | Serbian Academy of Sciences and Arts (SASA) [F-148]; Ministry of Education, Science and Technological Development of the Republic of Serbia [TR32026, OI171026] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs (Proceedings Paper) |
| Autori | Dankovic Danijel M Manic Ivica Dj Stojadinovic Ninoslav D Prijic Zoran D Djoric-Veljkovic Snezana M Davidovic Vojkan S Prijic Aneta P Paskaleva Albena Spassov Dencho Golubovic Snezana M |
| Info | 2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), (2017), vol. br. , str. 147-151 |
| Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Serbian Academy of Sciences and Arts (SASA) [F-148] |
| Ispravka | Web of Science Citati: Web of Science Scopus |
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